BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Control Station - ECPv6.15.20//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:Control Station
X-ORIGINAL-URL:https://controlstation.com
X-WR-CALDESC:Events for Control Station
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/New_York
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20250309T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20251102T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20260308T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20261101T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20270314T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20271107T060000
END:STANDARD
END:VTIMEZONE
BEGIN:VTIMEZONE
TZID:Europe/London
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20250330T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20251026T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20260329T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20261025T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20270328T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20271031T010000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261117T100000
DTEND;TZID=America/New_York:20261117T110000
DTSTAMP:20260507T171849
CREATED:20251117T172136Z
LAST-MODIFIED:20260420T164520Z
UID:37190-1794909600-1794913200@controlstation.com
SUMMARY:Measuring What Matters: A Faster Way of Isolating PID Control Loops that Undermine Production and Profit
DESCRIPTION:For decades\, discrete manufacturers have relied on Overall Equipment Effectiveness (OEE) to identify underperforming machines. As a normalized metric\, OEE can be applied consistently across individual assets\, production lines\, or entire cells. When a line’s OEE drops\, the math makes it easy to isolate the specific machine or asset dragging performance down. \nProcess manufacturers can apply this same powerful concept to PID controller performance—enabling objective benchmarking\, rapid root cause analysis\, and smarter optimization decisions. \nIntended for corporate and plant managers\, this session will equip participants to: \n\nUnderstand how the OEE framework can be applied to assessing controller performance at the loop\, unit\, and plant levels.\nUse this method pinpoints underperforming controllers and identifies root causes\, including tuning issues\, equipment problems\, or process changes.\nLeverage new KPI insights to prioritize improvements and drive plant-wide performance gains using a data-driven\, OEE-style approach.\n\nSee how applying proven OEE concepts to process control can simplify optimization and improve operational effectiveness. Register now to learn why leading manufacturers are embracing a new method.
URL:https://attendee.gotowebinar.com/register/4850608147482198107#new_tab
LOCATION:Interactive Online Learning
CATEGORIES:Public Webinar
ATTACH;FMTTYPE=image/webp:https://controlstation.com/wp-content/uploads/2025/11/Live-Webinar-Cover-.webp
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20261123T080000
DTEND;TZID=Europe/London:20261126T120000
DTSTAMP:20260507T171849
CREATED:20251104T170246Z
LAST-MODIFIED:20251104T191602Z
UID:37139-1795420800-1795694400@controlstation.com
SUMMARY:Techniques for Applied Process Control
DESCRIPTION:
URL:https://controlstation.com/event/techniques-for-applied-process-control-13/
LOCATION:Interactive Online Learning
CATEGORIES:Training
ATTACH;FMTTYPE=image/webp:https://controlstation.com/wp-content/uploads/2024/11/Morning-GMT.webp
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261208T080000
DTEND;TZID=America/New_York:20261211T120000
DTSTAMP:20260507T171849
CREATED:20251104T170045Z
LAST-MODIFIED:20260301T144053Z
UID:37135-1796716800-1796990400@controlstation.com
SUMMARY:Techniques for Applied Process Control
DESCRIPTION:
URL:https://controlstation.com/event/techniques-for-applied-process-control-9/
LOCATION:Interactive Online Learning
CATEGORIES:Training
ATTACH;FMTTYPE=image/webp:https://controlstation.com/wp-content/uploads/2024/11/Morning-EST.webp
END:VEVENT
END:VCALENDAR