Control Station has been fortunate to partner with leading, global OEMs like Yokogawa. Award-winning products like csTuner are helping process manufacturers at all stages of operation. As GranBio in Brazil
Studies show that when individuals are given a set of three options they are instinctively biased to prefer the middle one. When this finding is applied to purchasing behavior a
Effective Disturbance Rejection “When your only tool is a hammer, every problem looks like a nail” – a concept attributed to Abraham Maslow. Such can be the situation with process control
In the realm of process control it makes complete sense that the primary goal is - you guessed it - to control the process. For decades the PID controller has
Program Documents Process Improvements and Quantifies Financial Impact Tolland, CT – June 27, 2013 Control Station formally introduced a technology evaluation program centered on the company’s PlantESP platform. The program
Demand for Plant-Wide Monitoring and Diagnostic Solutions Continues to Increase February 13, 2013 Control Station today noted increased market demand for plant-wide monitoring capabilities in addition to expanded global sales of
PlantESP Actively Monitors Regulatory Controllers and Simplifies Root-Cause Analysis October 31, 2012 Control Station announced the addition of new and advanced process diagnostic capabilities to the Company’s PlantESP solution platform. The
New Feature Speeds Implementations and Aligns Solution with Six Sigma March 31, 2011 – Control Station announced enhancement of its PlantESP Performance Monitoring Solution with the introduction of an innovative
D/3 Loop Optimizer Targets Controller Diagnostic and Optimization Needs of NovaTech’s D/3 DCS Users January 12, 2010 – Control Station and NovaTech Process Solutions today formally announce its technology partnership.
Award Recognizes Technology’s Impact on Manufacturing Economics January 3, 2008 Control Station announced today that the Company’s LOOP-PRO Product Suite received the 2007 Vaaler Award. Chosen by a panel of
