For decades, discrete manufacturers have relied on Overall Equipment Effectiveness (OEE) to identify underperforming machines. As a normalized metric, OEE can be applied consistently across individual assets, production lines, or entire cells. When a line’s OEE drops, the math makes it easy to isolate the specific machine or asset dragging performance down.

Process manufacturers can apply this same powerful concept to PID controller performance—enabling objective benchmarking, rapid root cause analysis, and smarter optimization decisions.

Intended for corporate and plant managers, this session will equip participants to:

1) Understand how the OEE framework can be applied to assessing controller performance at the loop, unit, and plant levels.
2) Use this method pinpoints underperforming controllers and identifies root causes, including tuning issues, equipment problems, or process changes.
3) Leverage new KPI insights to prioritize improvements and drive plant-wide performance gains using a data-driven, OEE-style approach.

See how applying proven OEE concepts to process control can simplify optimization and improve operational effectiveness. Register now to learn why leading manufacturers are embracing a new method.